NPI co-organized the 307th CSCA Crystallographic Talks

With the participation of six dozen Czech and foreign experts, the 307th Talks of the Czech and Slovak Crystallographic Association (CSCA) on current matters in X-ray and neutron structural analysis took place in the ÚJV Řež Conference Center on September 26. The organizers of the event were the Department of Neutron Physics (DNP) NPI of the CAS, Institute of Inorganic Chemistry (IIC) of the CAS, Research Centre Řež (CVŘ) and ÚJV Řež. This Talks were subtitled Crystallography in the Nuclear Valley - from Materials for Nuclear Safety to Cultural Heritage.

The lecture program consisted of two sessions. As part of Analytical methods (not only) for materials for nuclear safety session, also our employees delivered lectures: Pavel Strunz, who presented the work of the Neutron Physics Laboratory of CANAM, and Vasyl Ryukhtin, who spoke about SANS investigation of microstructural changes in building material after various consolidating treatments. As part of the second session, titled Analytical methods (not only) for cultural heritage, our employee Vladimír Havránek spoke about the use of a high-energy ion microbeam in the Laboratory of Tandetron.

The event also offered its participants the opportunity to take part in one of three thematic excursions in the Řež research area. The topic Analytical methods (not only) for cultural heritage included a visit to our Laboratory of Tandetron accelerator and also X-ray powder (micro)diffraction, mobile FTIR and Raman spectrometer inside the ALMA workplace at IIC. The second option was the excursion to the facilities of the Neutron Physics Laboratory (part of the NPI´s CANAM infrastructure) at the LVR-15 research reactor, and finally, the third option was an excursion to two CVŘ workplaces within the topic Analytical methods for radioactive materials: hot cells (a workplace with equipment for the analysis of irradiated materials) and the Center for Highly Sensitive Analytical Instruments (CVCAP) Laboratories with equipment for FIB-SEM, HR-TEM, XRD and SIMS technologies.

Photo: Jan Trejbal, CVŘ